JY Emission has over 20 years experience in ICP systems. The JY ULTIMA series, shown at left, is the latest in a line of high resolution ICP Atomic and Optical Emission spectrometers for Elemental Emission analysis in Trace level Element analysis
         The PANORAMA Series of Simultaneous ICP Spectrometers offers the dedicated simultaneous analysis with the highest level of sample throughput. The series offers two models to suit an extensive range of applications and budgets
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